Abstract
The investigation of liquid/solid interfaces using X-ray photoelectron spectroscopy is still in its infancy, but several viable approaches for the characterization of these interfaces have been proposed over the last few years. Most of these schemes require the use of ambient pressure X-ray photoelectron spectroscopy (APXPS) due to the high vapor pressure of the liquids of interest. APXPS at high kinetic energies is especially valuable due to the extended mean free path of electrons at higher energies, which allows measuring liquid/solid interfaces in the presence of thicker solution layers. In this chapter we describe the basics of high-energy APXPS and review current schemes as well as application examples for the measurement of liquid/solid interfaces using photoelectron spectroscopy.
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