Abstract
Many synthetic and biopolymers are paracrystalline. The same holds for some catalysts, graphites and semiconductors. This can be proved directly by diffraction patterns, the integral widths being proportional to (sin ϑ)2 for the higher orders of reflection of the same net plane. To test this, three orders of reflections must be observable. Warren, on the other hand, has shown that microstrains with a Gaussian distribution can directly be calculated from the line profiles of only two reflections by Fourier-Transformation. His method is expanded here to other types of microstrains and to paracrystalline distortions by carefully taking into account a termination effect. Examples are given for turbostratic graphite, linear polyethylene and annealed polybutene I. They demonstrate how useful this method is for distortion analysis.
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