Linewidth properties of double-layer surface-relief resonant Brewster filters with equal refractive index

Abstract

In this paper, double-layer surface-relief resonant Brewster filters consisting of a homogenous layer and a grating with equal refractive index are obtained by adjusting the grating filling factor, and linewidth properties of these types of filters are investigated. It is shown etch depth error does not change the filter linewidth, but the grating filling factor and the substrate refractive index can significantly change the filter linewidth. Moreover, the coupling strength can be appreciately affected by the homogeneous layer thickness, and one can obtain different linewidths at the same operating wavelength by selecting different homogeneous layer thickness with other physical parameters maintained.