Abstract
We present a data-to-model fitting approach to estimate the linewidth enhancement factor (LEF) of semiconductor lasers using optical feedback self-mixing interferometry (OFSMI) operating in the weak feedback regime. Existing data-to-model fitting techniques require a priori knowledge regarding target moving trajectory or displacement which restricts their applicability. This paper addresses this issue by proposing a genetic algorithm (GA) to estimate OFSMI system parameters including the LEF based on observed data without prior information. The performance of this method has been verified through both simulation and experimentation, which indicates an accuracy of 3.8% for the LEF measurement.
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