Linearity Theory of Stochastic Phase-Interpolation Time-to-Digital Converter

Abstract

The Stochastic Phase-Interpolation Time-to-Digital Converter (SPI-TDC) leverages redundancy to tolerate Process-Voltage-Temperature (PVT) variations. This article presents a comprehensive analysis of the linearity of the SPI-TDC and its error mechanisms, and proposes a linearization technique to reduce the redundancy requirement. Using deterministic and stochastic models, this article analyzes the effects of the unit delay, length of the delay-line, clock frequency, jitter, and mismatch on the linearity of the SPI-TDC, and prescribes a compact set of design equations to guide the designer. Based on the results of the analysis, the article proposes a robust solution using a Delay-Locked Loop (DLL) to linearize the SPI-TDC with reduced hardware and power overhead. This article also analyzes, for the first time, the loop dynamics of a DLL accounting for the delay of the delay-line. Measurements of an 8-bit, 60-MHz SPI-TDC validate the theories and demonstrate the effectiveness of the proposed solution across supply and temperature variations while using only $4\times $ redundancy.