Abstract
Measurements of statistical quantities other than the spectrum can distinguish between different $\frac{1}{f}$ noise mechanisms. One such quantity, the average behavior before and after a given fluctuation amplitude, is used to determine if the noise mechanism is linear. Measurements on different sources show that $\frac{1}{f}$ noise in some systems, such as carbon resistors and field-effect transistors, is due to a linear mechanism, while other systems, such as $p\ensuremath{-}n$ junction devices, require a nonlinear mechanism.
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