Linearity evaluation of a THz-TDS system by a step attenuator using metalized films

Hitoshi Iida,Keiko Kitagishi,Yusuke Izutani,Yozo Shimada,Moto Kinoshita,Hideki Kuroda

doi:10.1109/cpem.2012.6251102

Linearity evaluation of a THz-TDS system by a step attenuator using metalized films

Hitoshi Iida, Keiko Kitagishi + Show 4 more

https://doi.org/10.1109/cpem.2012.6251102

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Publication Date: Jul 1, 2012

Citations: 1

Affiliation: Otsuka (Japan)

#Terahertz Time-domain Spectroscopy System #Thin Polyester Films + Show 8 more

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Abstract

We have experimentally developed a terahertz wave step attenuator (TSA) to evaluate linearity of a terahertz time-domain spectroscopy (THz-TDS) system. The TSA is constructed by stacking metalized-film attenuators (MFAs) which have different transmittance. Sputter deposition of Inconel® alloy on thin polyester films is used to fabricate the MFAs. Good repeatability and flatness of the TSA are confirmed in a transmission measurement by the THz-TDS system. This paper reports on linearity evaluation of the THz-TDS system by using the TSA.

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