Abstract

Linearity and resolution of a one dimensional position sensitive Si surface barrier detector were investigated. The experimental results agree within 20% with those predicted theoretically 1,2). The parameters of the detector were: active area 53 × 8 mm 2, junction capacitance 150 pF, resistance of the back layer 7.2 kΩ. The pulse shaping network consisted of a 0.7 μsec RC integration and 0.7 μsec single delay line clipping filter. The electronic noise of the position information was measured to be 52 keV (0.5 mm at 5.5 MeV) fwhm Si. The electronic noise of the energy information was 31 keV. Using 5.5 MeV α-particles we measured 59 keV (0.57 mm) and 35 keV resolution respectively. The non-linearity of the characteristics was less than 1% indicating that the variation of the position dependent ballistic deficit was also less than 1%.

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