Linear Support Vector Machine Classification of Plant Stress From Soybean Aphid (Hemiptera: Aphididae) Using Hyperspectral Reflectance.

Abstract

Spectral remote sensing has the potential to improve scouting and management of soybean aphid (Aphis glycines Matsumura), which can cause yield losses of over 40% in the North Central Region of the United States. We used linear support vector machines (SVMs) to determine 1) whether hyperspectral samples could be classified into treat/no-treat classes based on the economic threshold (250 aphids per plant) and 2) how many wavelengths or features are needed to generate an accurate model without overfitting the data. A range of aphid infestation levels on soybean was created using caged field plots in 2013, 2014, 2017, and 2018 in Minnesota and in 2017 and 2018 in Iowa. Hyperspectral measurements of soybean canopies in each plot were recorded with a spectroradiometer. SVM training and testing were performed using 15 combinations of normalized canopy reflectance at wavelengths of 720, 750, 780, and 1,010 nm. Pairwise Bonferroni-adjusted t-tests of Cohen's kappa values showed four wavelength combinations were optimal, namely model 1 (780 nm), model 2 (780 and 1,010 nm), model 3 (780, 1,010, and 720 nm), and model 4 (780, 1,010, 720, and 750 nm). Model 2 showed the best overall performance, with an accuracy of 89.4%, a sensitivity of 81.2%, and a specificity of 91.6%. The findings from this experiment provide the first documentation of successful classification of remotely sensed spectral data of soybean aphid-induced stress into threshold-based classes.