LINEAR OPTICAL SPECTROSCOPIES FOR SURFACE STUDIES

Abstract

Surface Review and LettersVol. 07, No. 04, pp. 399-410 (2000) No AccessLINEAR OPTICAL SPECTROSCOPIES FOR SURFACE STUDIESYVES BORENSZTEINYVES BORENSZTEINLaboratoire d'Optique des Solides, UMR CNRS 7601, Universitée Pierre et Marie Curie, Case 80, 4 Place Jussieu, 75252 Paris Cedex 05, Francehttps://doi.org/10.1142/S0218625X00000403Cited by:22 PreviousNext AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail FiguresReferencesRelatedDetailsCited By 22Noncontact AFM and differential reflectance spectroscopy joint analyses of bis-pyrenyl thin films on bulk insulators: Relationship between structural and optical propertiesFranck Bocquet, Laurent Nony, Franck Para, Philipda Luangprasert and Jean-Valère Naubron et al.22 June 2018 | Physical Review B, Vol. 97, No. 23Silicene multilayers on Ag(111) display a cubic diamondlike structure and a √3×√3 reconstruction induced by surfactant Ag atomsYves Borensztein, Alberto Curcella, Sébastien Royer and Geoffroy Prévot6 October 2015 | Physical Review B, Vol. 92, No. 15Optical referencing in differential reflectance spectroscopyH Zaglmayr, C G Hu, L D Sun and P Zeppenfeld22 September 2014 | Measurement Science and Technology, Vol. 25, No. 11Large differences in the optical properties of a single layer of Si on Ag(110) compared to siliceneYves Borensztein, Geoffroy Prévot and Laurence Masson9 June 2014 | Physical Review B, Vol. 89, No. 24Unusual Two-Stage Kinetics of Ethylene Adsorption on Si(100) Unraveled by Surface Optical Spectroscopy and Monte Carlo SimulationRomain Coustel, Yves Borensztein, Olivier Pluchery and Nadine Witkowski27 August 2013 | Physical Review Letters, Vol. 111, No. 9In-situ, Real-Time Investigation of Organic Thin Film Growth Using Reflectance Difference SpectroscopyLidong Sun and Peter Zeppenfeld1 Jan 2013Optical differential reflectance spectroscopy on thin molecular filmsRoman Forker, Marco Gruenewald and Torsten Fritz1 Jan 2012 | Annual Reports Section "C" (Physical Chemistry), Vol. 108Characterization of Chemical Bonding in Ion-Implanted Polymers by Means of Mid-Infrared ReflectivityVictor G. Ivanov, Georgi Hadjichristov and Eric Faulques1 September 2009 | Applied Spectroscopy, Vol. 63, No. 9Adhesion of growing nanoparticles at a glance: Surface differential reflectivity spectroscopy and grazing incidence small angle x-ray scatteringR. Lazzari, G. Renaud, C. Revenant, J. Jupille and Y. Borensztein24 March 2009 | Physical Review B, Vol. 79, No. 12Optical differential reflectance spectroscopy of ultrathin epitaxial organic filmsRoman Forker and Torsten Fritz1 Jan 2009 | Physical Chemistry Chemical Physics, Vol. 11, No. 13Reflectance-anisotropy spectroscopy and surface differential reflectance spectra at the Si(100) surface: Combined experimental and theoretical studyMaurizia Palummo, Nadine Witkowski, Olivier Pluchery, Rodolfo Del Sole and Yves Borensztein30 January 2009 | Physical Review B, Vol. 79, No. 3Adsorption of Phenylacetylene on Si(100)-2 × 1: Kinetics and Structure of the AdlayerOlivier Pluchery, Romain Coustel, Nadine Witkowski and Yves Borensztein26 October 2006 | The Journal of Physical Chemistry B, Vol. 110, No. 45Investigation of molecule chemisorption on Si(001)2 × 1 surfaces by surface reflectance spectroscopiesO. Pluchery, N. Witkowski and Y. Borensztein1 Nov 2005 | physica status solidi (b), Vol. 242, No. 13Probing the Si-Si Dimer Breaking of Si(100)2×1 Surfaces upon Molecule Adsorption by Optical SpectroscopyY. Borensztein, O. Pluchery and N. Witkowski7 September 2005 | Physical Review Letters, Vol. 95, No. 11In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different substratesHolger Proehl, Robert Nitsche, Thomas Dienel, Karl Leo and Torsten Fritz22 April 2005 | Physical Review B, Vol. 71, No. 16Optical response of clean and hydrogen-covered vicinal Si(001) 2 × 1 surfacesY Borensztein and N Witkowski21 September 2004 | Journal of Physics: Condensed Matter, Vol. 16, No. 39Apparatus for real time in situ quantitative studies of growing nanoparticles by grazing incidence small angle X-ray scattering and surface differential reflectance spectroscopyG Renaud, M Ducruet, O Ulrich and R Lazzari1 Aug 2004 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 222, No. 3-4Formation of Solid-State Excitons in Ultrathin Crystalline Films of PTCDA: From Single Molecules to Molecular StacksHolger Proehl, Thomas Dienel, Robert Nitsche and Torsten Fritz25 August 2004 | Physical Review Letters, Vol. 93, No. 9Isotropic and anisotropic optical reflectances of clean and hydrogen‐covered Si(001)2x1 surfacesY. Borensztein, N. Witkowski and S. Royer5 December 2003 | physica status solidi (c), No. 8Direct Kinetic Study of the Reaction of Cl 2•- Radical Anions with Ethanol at the Air−Water InterfaceR. S. Strekowski, R. Remorov and Ch. George20 March 2003 | The Journal of Physical Chemistry A, Vol. 107, No. 14GranFilm: a software for calculating thin-layer dielectric properties and Fresnel coefficientsRémi Lazzari and Ingve Simonsen1 Nov 2002 | Thin Solid Films, Vol. 419, No. 1-2NESSPIOM?Network for enhanced semiconductor surface processing throughin situ optical monitoringMartyn E. Pemble1 January 2001 | Surface and Interface Analysis, Vol. 31, No. 10 Recommended Vol. 07, No. 04 Metrics History Received 5 June 2000 PDF download