Abstract

AbstractWe report new results on the design, fabrication and characterization of a novel midinfrared sensor called quantum dot avalanche photodiode (QDAP). The QDAP consists of a quantum dots‐in‐a‐well (DWELL) detector coupled with an avalanche photodiode (APD) through a tunnel barrier. In the QDAP, the photons are absorbed in the DWELL active region while the APD section provides gain.Photocurrent and noise measurements at 77 K were taken to characterize the response of the device. The nonlinear increase in the photocurrent as the APD voltage increases support theoretical predictions about the QDAP capability to work in applications with low photon flux levels. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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