Abstract
A novel fabrication procedure is developed that allows for the direct measurement of the linear electrooptic coefficient of semiconducting nanowires to determine their viability for use in electrooptic devices. Vertically aligned InP nanowires are transferred from their growth substrate to a glass substrate using a host polymer, while still retaining the alignment of the nanowires. The linear electrooptic coefficient of the InP nanowires exhibited a 1-2 orders of magnitude enhancement over bulk InP and ranged from 31 to 147 pm/V. The figure of merit, n3r, exhibited a factor of 20 enhancement over lithium niobate and ranged from 1010 to 4817 pm/V.
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