Abstract

Titanium dioxide films were prepared by plasma ion-assisted electron beam evaporation. Linear optical properties were investigated in terms of spectrophotometry using the beta-distributed oscillator (ß_do) model as a parametrized dispersion law. The nonlinear two-photon absorption coefficient of titanium dioxide was determined by means of the laser-induced deflection technique at a wavelength of 800 nm. The obtained values of (2–5) × 10−11 cm/W were consistent with published experimental values for rutile as well as for simulations performed in the frames of the ß_do and Sheik–Bahae models.

Highlights

  • The standard theoretical apparatus used for modeling the optical properties of multilayer systems is formulated in terms of linear optics, i.e., it is based on a linear relationship between the electric field strength and the polarization induced in the medium

  • The linear optical constants of the titanium dioxide samples were fitted by means of Equation

  • We presented experimental results on the optical properties of plasma ion-assisted evaporation (PIAD) titanium dioxide thin films, with a focus on their absorption behavior

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Summary

Introduction

The standard theoretical apparatus used for modeling the optical properties of multilayer systems is formulated in terms of linear optics, i.e., it is based on a linear relationship between the electric field strength and the polarization induced in the medium Within this framework, commonly used calculation recipes, such as matrix formalism or the admittance approach, have been derived in relevant textbooks [1,2,3,4]. In high-power laser systems, the electric field in the incident light beam may be strong enough to induce relevant nonlinear optical effects in the coating materials. In many cases, it is the third-order (cubic) optical nonlinearity that dominates the nonlinear response. TiO2 thin optical films at a wavelength of 800 nm and discuss the results with respect to the predictions of two different theoretical approaches

Theoretical Background
PIAD Film Deposition
Spectrophotometric Characterization
Direct Absorption Measurements
Linear
Nof the order
LID: Absorption Properties of the Films
Film Absorption
Considerations Regarding Nonlinear Refraction
This is shown
Conclusions
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