Abstract
Line tension of hexaethylene glycol on a silicon wafer is measured with positive values up to +2.5x10(-11) N below a contact angle of 6 degrees and negative values down to -2x10(-10) N above 6 degrees, as expected for a first-order wetting system. From the measured interface potentials, a semiquantitative model function for the overall interface potential is derived as a superposition of a constant nonretarded van der Waals interaction with a Hamaker constant of -2.6x10(-19) J and an exponentially decaying term, allowing the prediction of a finite positive line tension at the wetting transition.
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