Abstract
The mutual effect of two neighbouring lines on X-ray and electron diffraction patterns is treated theoretically. The theory is in qualitative agreement with the experimental results of electron diffraction photographs (taken on plates) but cannot be used to correct these quantitatively on account of the practical difficulty of making the necessary measurements. In certain X-ray photographs (taken on films) there arises an effect, not treated by the theory, which for low values of Bragg angle acts in an opposite sense. The general conclusion is that for precision measurements close groups of lines should be treated with circumspection or altogether avoided.
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