Line Array Time Delay Integral CCD Sweep Image Non-Uniformity Correction Method

Abstract

Abstract There are many non-uniformity factors for the original array time delay integral CCD sweep image. Firstly, the non-uniformity characteristics such as parallel detector direction, vertical detector direction and multi-detector are counted. According to the difference of the regular response caused by the inconsistent response of the detector and the dimming of the optical system, the multiplicative original image obtained under similar conditions is used to statistically calculate the multiplicative component of the non-uniform correction coefficient of each pixel in the detection direction. The change of the attitude of the platform and the difference of the atmospheric reflection energy cause the difference of the radiation in the sweeping direction. For each original image, the additive component of the non-uniform correction coefficient of each line of the sweeping direction is calculated. Then, the multiplicative component and the additive component are used to the linear array. The original image of the camera is quickly corrected pixel by pixel. For the multi-line array detector splicing camera, the multi-detector image is automatically seamlessly spliced by the uniform processing of overlapping pixels.