Abstract
The Laser Intensity Modulation Method (LIMM) is used to determine the spatial distribution of polarization in the direction of the polar axis of a ferroelectric sample. It is based upon measurement of the pyroelectric current generated by the material when it is heated with a laser beam which is intensity-modulated over a range of frequencies. A modification of this technique has been developed which will permit detailed profiling of the polarization distribution in a thin-film electroded ferroelectric layer on a substrate, such as a ferroelectric memory. The theory of the technique is discussed and it is shown that the determination of the polarization distributions requires the solution of a Fredholm integral equation of the 1st kind using experimental data. A novel method of solution of this problem using neural networks is described.
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