Limiting the effects of radiation damage in charge-coupled devices by control of operating conditions

Abstract

Particle irradiation tests and theoretical prediction programmes, mounted as part of the European Space Agency's TRP project, show the way in which damage in EEV scientific CCDs increases with time in space. Radiation damage levels expected with the passage of time in various orbits can be estimated using test results backed by prediction techniques. The authors describe these techniques and outline engineering measures to harden the system, by trading off such parameters as orbit altitude, chip temperature and shield weight. >