Abstract
A way to plot the light-scattering indicatrix for crystals in the form of rectangular parallelepipeds of different crystallophysical orientations has been proposed. The experimental setup, which makes it possible to record the intensity of light scattered in these samples in the plane oriented perpendicular to the input face, has been designed. The light-scattering indicatrices for langasite crystals have been plotted in the XY and YZ planes. The reflectance and transmittance of the samples under the normal incidence of light have been estimated. The maximum angle at which the light scattered within the crystal bulk emerges from it without total internal reflection has been found. The angle by which langasite crystal should be rotated to record the scattered-light intensity by a photodetector has been experimentally determined.
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