Abstract
AbstractA general equation describing the small‐angle Hv light‐scattering intensity for a system of N undeformed spherulites located at random within the sample and taking into account the truncation and interference effects is given. Scattering contour plots or radial scans are reported for various arrangements of the N spherulites. The results show that the interference effect may explain the speckled appearance of the experimental patterns. Moreover, the interference and truncation effects (for the special cases where truncation is considered here) do not seem to shift the position of the maximum scattering angle of the cloverleaf pattern as calculated from the single spherulite theory. Finally, the calculations show that the truncation effect increases the relative intensity of the pattern at large and low scattering angles and at azimuthal angles 0 and 90°C, as compared with the intensity at the position of maximum scattering angle.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Polymer Science: Polymer Physics Edition
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
