Abstract

For the first time, two different sets of polytype Thue–Morse multilayered porous silicon structures are studied to investigate the reflection of light in aperiodic dielectrics. The optical response of the samples was studied before and after oxidation. The results were compared with the classical periodic structure, and an enhancement in the number of photonic bandgaps with a significant blue shift in reflectance peaks, in some of the structures, were observed. Numerical simulation along the lines of the transfer matrix approach is also presented.

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