Abstract
Scanning tunneling microscope induced light emission from an atomic or molecular junction has been probed from the tunneling to contact regime in recent experiments. There, the intensity of the light emission shows strong correlation with the current/charge fluctuations at optical frequencies. We show that this is consistent with the established theory in the tunneling regime, by writing the finite-frequency shot noise as a sum of inelastic transitions between different electronic states. Based on this, we develop a practical scheme to perform calculations on realistic structures using Green's functions. The photon emission yields obtained re-produce the essential feature of the experiments.
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