Abstract
We have investigated the depolarization effects of light scattered by sharp tips used forapertureless near-field optical microscopy. Dielectric and metal coated tips have beeninvestigated and depolarization factors between 5 and 30% have been measured, changingas a function of the incident light polarization and of the tip shape. The experimentalresults are in good agreement with theoretical calculations performed by the finite elementmethod, giving a near-field depolarization factor close to 10%. The effect of depolarizationhas been investigated in polarized tip-enhanced Raman spectroscopy (TERS)experiments; the depolarization gives rise to forbidden Raman modes in Si crystals.
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