Abstract
We report a method of scanning and deflecting a light beam in an electro-optic waveguide of epitaxial LiNbO3 film. The method involves the use of the electro-optic effect for excitation of a proper distribution of the refractive index which causes the light beam to deflect. The angle of deflection is found to vary continuously with the intensity of the applied field. We are able to scan a light beam in the plane of the film up to 4°. We also present a theory for the light beam deflection and show that our method does optimize the deflection efficiency.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
