Abstract
Lifetime-broadening-suppressed (LBS) state-selective XAFS spectra can be deduced by analyzing resonant inelastic x-ray scattering (RIXS) in terms of formulae derived from the Kramers-Heisenberg equation. By a combination of third-generation synchrotron sources and spectrometers equipped with a large acceptance as well as high-resolution analyzers, high-quality RIXS data to extract LBS selective XAFS can be collected. In this review, basic aspects of this novel technique are described, and its potentiality as an analytical tool to determine the local electronic and magnetic structures of metal atoms is demonstrated with several recent examples.
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