Abstract
Resonant inelastic x-ray scattering (RIXS) is uniquely related to x-ray absorption oscillator strength distribution by Kramers–Heisenberg equation via lifetime widths of the states involved. By using RIXS spectra of CuO it is shown that XANES, where the lifetime broadening (LB) of the 1s core-hole is removed and that of the 2p hole determines the resolution, can be analytically deduced from RIXS profiles. Furthermore, it is demonstrated that numerical procedures can eliminate also the remaining 2p broadening, providing LB-free XANES.
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