Life Prediction of Residual Current Device Based on Wiener Process with GM (1, 1) Model

Abstract

Residual current device (RCD), the critical equipment to protect the safety of electrical users, are known to experience performance degrade over time during their use lifetime. Therefore, in order to promptly replace the RCD before failure, it is very important to predict its lifetime. In order to predict the remaining life of the RCD, a constant‐stress accelerated degradation test (CSADT) and a combination prediction model are proposed. First, the CSADT is conducted with temperature as the acceleration stress and the residual operating current as degradation characteristic. Then, based on the prediction result of pseudo failure life, a combination model of Wiener process and GM (1, 1) model is given. Finally, the remaining life of the RCD under normal use environment is extrapolated. © 2021 Institute of Electrical Engineers of Japan. Published by Wiley Periodicals LLC.