Abstract

Algae contamination accumulated on the surface of insulators will affect the electrical properties of insulators. At present, the characterization method of algae contamination is the image method, which determines the distribution of algae contamination through colour. The detection results are affected by environmental changes and the growth state of algae. This paper puts forward a method of detecting polluted insulator surface with algae by using laser-induced breakdown spectroscopy (LIBS) technique, combined with the scanning electron microscope (SEM), inductively coupled plasma emission spectrometer (ICP), analyzed by the spectra of algae contamination. Mg, Ca, Fe are selected as the analytical element. The classification of algae contamination, non-algae contamination and no contamination are realized with the principal component analysis (PCA). The research results are of great significance for characterization of algal pollution on insulator surface by LIBS.

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