Abstract
ABSTRACTThin films of crystalline and amorphous V2O5 were deposited by pulsed laser deposition (PLD) and the chemical diffusion coefficients, , were measured by the potentiostatic intermittent titration technique (PITT). In crystalline V2O5 films, the maximum and minimum were found to be 1.7 × 10−2 cm2/s and 5.8 × 10−15 cm2/s respectively, with a general trend for to rise in single-phase regions. The changes in correlated well to the known phases in LiV2O5. In amorphous V2O5 films, exhibited a smooth, continuous decrease as the Li concentration increased.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
