Abstract
Rutherford backscattering (RBS) measurements of 4.2 MeV Li and 2.4 MeV He ions were done for YBaCuO and GdBaCuO high-Tc superconductor films deposited on MgO and SrTiO3 single crystalline substrates and for their bulk samples. Energy spectra of both ions were calculated using the RBS analysis program rewritten by the authors. Comparisons between these two non-destructive techniques showed some advantages in analyzing the layer thickness and composition ratios of those thin films by MeV Li ions backscattering. Estimated errors are within 7% for the measured elemental concentrations and 10% for the layer thickness in our experiments. A brief discussion is also made of the results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
