Abstract
The leveling capability of sol–gel SiO 2 layers onto titanium and Kovar (Fe54 Ni29 Co17) foil substrates has been analyzed by atomic force microscopy (AFM) and profilometer roughness measurements as a function of the sol–gel preparation parameters. SiO 2 coatings have been prepared by immersion of metallic foils in a solution where the [alkoxide]/[EtOH] ratio was between 0.05 to 0.7, and subsequent withdrawal of the samples at a constant rate between 8 and 49 cm/min. By increasing the [alkoxide]/[EtOH] ratio and/or the withdrawal velocity, the SiO 2 layer thickness and leveling capability increase but its mechanical integrity decreases. By increasing SiO 2 film thickness, better coverage of large-scale heterogeneities but poorer coverage of short-scale features have been observed. A compact (cracks and striations free) coverage which minimizes the roughness sample surface at short and large scales has been obtained by applying successive SiO 2 layers with various thicknesses.
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