Abstract
Frequency-modulation atomic force microscopy has turned into a well-established method to obtain atomic resolution on flat surfaces, but is often limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point and thin water layers present on practically every surface, complicating stable imaging with high resolution. We demonstrate high-resolution imaging in air using a length-extension resonator operating at small amplitudes. An additional slow feedback compensates for changes in the free resonance frequency, allowing stable imaging over a long period of time with changing environmental conditions.
Highlights
Frequency-modulated atomic force microscopy (FM-AFM) is the method of choice to image nanoscale structures on surfaces down to the atomic level
Whereas atomic resolution is routinely achieved in ultra-high vacuum (UHV), it remains a challenge under ambient conditions
We have demonstrated high-resolution FM-AFM imaging under ambient conditions with the length-extension resonator
Summary
Frequency-modulated atomic force microscopy (FM-AFM) is the method of choice to image nanoscale structures on surfaces down to the atomic level. Measurements under ambient conditions are influenced by variations of the dew point and thin water layers present on practically every surface, complicating stable imaging with high resolution. We demonstrate high-resolution imaging in air using a length-extension resonator operating at small amplitudes.
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