Abstract
Ion scattering spectrometry (ISS) has developed as a useful method of analysing the structure of single-crystal surfaces. In this paper, the strengths and weaknesses of four techniques of low-energy ion scattering (LEIS) are discussed in reference to the analysis ofc(2 × 2)O/Ni(001), (2 × 1)O/Ni(110)and CaF 2/Si(111). The techniques are LENRS (low-energy negative recoil spectrometry), CAICISS (coaxial impact ion scattering spectrometry) and conventional LEIS using inert gas and alkali ions.
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