Abstract
Abstract Periodic stepped surfaces prepared on vicinal silicon (100) by ion bombardment and annealing have been studied by LEED. An unusual aspect of the diffraction patterns from [011] zone samples was the presence of fractional order multiplets with half the splitting of the integral order doublets. An explanation is given, based on the superposition of diffraction from three distinct domain types. These differ in the orientations of their dangling bonds and the arrangements of successive terraces. The simpler patterns from [001] zone samples evidenced just two reconstruction domains. All non-integral order beams disappeared when samples were exposed to ionized hydrogen. This facilitated both the identification of certain lattice distortions, and the determination of step heights, which were found to be two atomic layers in all cases.
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