LEED intensity measurements of Cu epitaxially grown on Ni(100)

Abstract

LEED intensity measurements are reported for pure Ni(100), and for one monolayer, four and nine layers of Cu on Ni(100). The intensities of the (00), (10), (11), (20) and (22) sets of spots were measured using a spot photometer. The largest variation in the intensity pattern with coverage was observed for the (00) spot. Dynamical calculations were performed for the specular and non-specular beams. It is found that the clean Ni(100) surface has the same interlayer distance as bulk nickel, while one monolayer of Cu on Ni(100) is found to be expanded by about 1.7%.