Abstract
Existing LED life test methods possess several drawbacks such as long test cycle and low efficiency. A new approach is proposed to solve these problems: firstly, the method utilize step down stress accelerated life test (SDS ALT) to obtain the LED failure data, secondly, adopt the least square method to extract the parameters of Inverse power law function, at last, the Nelson model and statistical method are used to transform the LED life data in condition of the accelerated stress to the LED rated current condition. A contrast constant stress ALT is implemented. The results of the experimental verification show that the LED life is characterized by lognormal distribution and the accelerated life model meets inverse power law function. Compared to the contrast test, approximate mean and median life for the same batch LED devices are obtained, The test cycle of SDS ALT is much lower than the one of constant stress ALT.
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