Learning about modes in atomic force microscopy by means of hands-on activities based ona simple apparatus

Abstract

This study was conducted to examine the results of using a low-cost hands-on setup incombination with accompanying activities to promote understanding of the contact modeof atomic force microscopy (AFM). This contact mode setup enabled learners to study howAFM works by hand scanning using probing cantilevers with different characteristics ontwo types of artificial surface. They also learnt how to select the various probing cantileverson the basis of their understanding of the advantages and disadvantages of using them.