Abstract

During recent years, portable plant phenotyping instruments have become increasingly important to monitor conditions of plant health non-destructively in the greenhouse and field environments. These devices, such as the Soil Plant Analysis Development (SPAD) meter, leverage indices that represent leaf chlorophyll content due to its strong correlation with leaf nitrogen (N) content. However, instruments such as SPAD meters are expensive and measure only individual, restricted leaf regions per data capture. In this publication, we developed a Leaf Scanner device to analyze the chlorophyll content distributions of whole leaves with greater efficiency and precision. The validating samples for this device were top-collared corn leaves grown under high and low N treatments in a greenhouse. For each region of a corn leaf, this device rapidly flashed visible and near infrared (NIR) LEDs to obtain the visible and NIR transmittance images of leaves. These images were summarized pixel-wisely into the Green NDVI index. A sufficient high framerate permitted continuous collection of regional index images. Using image registration techniques, these regional images were stitched together into a ‘leaf panorama’. The total pixel amount of each leaf panorama, thus, served as a substitute for leaf area. A Minolta SPAD-502Plus meter collected ground-truth measurements along the length of each leaf sample. The results showed that there was a strong correlation between the average Leaf Scanner’s measurements and averaged SPAD values (R2 = 0.92), and the Leaf Scanner was able to clearly detect differences between high and low fertilized samples in terms of chlorophyll content and leaf area. Furthermore, this Leaf Scanner device enabled us to study the chlorophyll content distributions on the plants under different treatments.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call