Abstract
IrMn-based spin-valve systems with CoFe and CoFe/FeNi combinations serving as hard and soft magnetic layers, respectively, were investigated by polarized soft X-ray scattering at photon energies close to the L absorption edges of the constituent elements. Structural and magnetic information was obtained making use of the XMCD (X-ray magnetic circular dichroism) technique in reflection. Hysteresis loops of the individual layers in the spin-valve system were measured element-selectively by tuning the incidence angle of the radiation, opening the possibility of magnetic depth profiling.
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