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Abstract
MoS2 flakes have attracted much attention due to their attractive properties. Optical reflectance techniques can prove to be very powerful techniques to study some of the thickness dependent physical properties, e.g. A and B excitonic peaks. Here, we measured reflection spectra of MoS2 flakes on SiO2/Si substrate in the broad wavelength range of 400-800 nm and studied the emission wavelength of A and B excitons as a function of the layer number. Moreover, we calculated the optimized SiO2 thickness to avoid the substrate-related interference effect influencing the investigation of exciton properties.
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