Abstract
Abstract High resolution X-ray scattering studies of thin smectic C* (SC) samples prepared between solid plates coated with obliquely evaporated silicon monoxide to favor surface director orientation tilted out of the surface plane, reveal a local layer structure which is dependent on the evaporation directions on the plates. Samples with the evaporation directions antiparallel exhibit uniformly tilted layers. Those with parallel evaporation directions exhibit a zig-zag defect free chevron structure of tilted layers.
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