Abstract
This paper gives the Laue distribution of time delay of electrical breakdown (td) for five pressure values of nitrogen in gas-filled diodes. Distributions were obtained for 20% overvoltage, and passive time ( tau ) 5 s and 7.2*103 s. The breakdown in nitrogen is induced by long-lived metastable states formed in the previous gas ionisation. The results show that the Laue distributions also hold for such groups of data when td varies between a fraction of a second and several hundreds of seconds.
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