Abstract
Distinctive flickering movements are observed in TEM images of the microstructure of Cu-Mn alloys after aging within the miscibility gap. Analyses of two-beam image extinction and electron diffraction streaks indicate that the underlying tweed and V-shaped images involve a static displacement field of the type {110} . Atomic force microscopy and other microanalyses show the presence of Mn-enriched colonies of 15-40 nm, formed throughout the microstructure, in which twinned fct crystallites are induced and confined. The flickering movements are interpreted as a direct manifestation of the fcc→fct transformation event and in particular of a rotation of the fct c-axis, these effects being caused by an inelastic interaction between phonons and the accelerated electrons of the incident TEM beam.
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