Abstract

Strained layered superlattices of Au and Ni have been grown by sputter deposition. The repeat periodicity, d Au/Ni , of the (111) oriented submicron thick films ranged from 0.78 to 4.60 nm. A variation of lattice spacing, d 111 , in the superlattice growth direction, with the repeat periodicity of the superlattice has been measured using standard theta/2theta CuKa x-ray diffraction. A minimum in (1/d 111 ) was found at d Au/Ni equal 2 nm, with increasing values of (1/d 111 ) above and below this repeat period. This variation of (1/d 111 ) with d Au/Ni , reported for the first time for the Au/Ni system, is anticipated in thosenoble/transition metal superlattice systems which exhibit the supermodulus effect“.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.