Abstract
The lattice sites of implanted In atoms in Cr2O3 were investigated by means of electron emission channeling (EC) measurements using 111In probe atoms. EC spectra were recorded for several axes and compared to simulations. Indium atoms are most likely located at near-Cr sites. Small differences in the EC patterns for prompt and delayed electrons may be an indication for displacements of 111Cd emitter atoms following the electron capture decay of In.
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