Abstract
Extended x-ray absorption fine structure (EXAFS) data were measured at three temperatures (20 K, 80 K and 300 K) above the L3-edge of polycrystalline α-tantalum. The data analysis is based on a recently developed Bayesian approach and uses the FEFF8 code results. Besides the temperature dependence of the lattice constant we obtain a separation of the Debye–Waller parameters into structural and thermal contributions. The latter are well described by a force-field model with two force parameters. A posteriori errors and cross correlations between the model parameters are calculated, taking the errors of the input EXAFS function as well as systematic uncertainties of the model into account. Lattice-dynamical observables determined independently are compared with the results of our force-field model using the parameters from the fit of our EXAFS data.
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