Abstract
Bi 12SiO 20 crystals doped with Cu were grown by the Czochralski method along 〈 001 〉 from a melt. The concentration of the impurities was determined by electro–thermal and flame atomic absorption spectroscopy. The lattice parameter a o = 10.165 Å was determined by single-crystal diffractometry. Results from Raman measurements in different scattering configurations lead to the conclusion that distinguishable structural distortions of the bismuth–oxygen framework of the sillenite lattice take place due to Cu doping.
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