Abstract
The lateral structures of dried thin films of the ampholytic diblock copolymer poly((methacrylic acid)-block-((dimethylamino)ethyl methacrylate)) adsorbed from dilute aqueous solution onto silicon substrates were investigated by scanning force microscopy (SFM) and diffuse X-ray scattering. The adsorbed amount of polymer, as a function of pH, reveals a maximum near the isoelectric point (IEP) of the polyampholyte. Different lateral structures are determined for samples adsorbed at pH values above the maximum of the adsorbed amount, as compared to the ones adsorbed at pH values below this maximum. At a pH around the IEP, the polyampholyte precipitates and the layers are formed by adsorption of flocks with sizes in the micrometer range. Lateral structures measured by SFM are similarly detected by diffuse X-ray scattering. The later technique delivers a statistical description of the lateral surface structures averaged over a larger area. The structures investigated are related to the polyampholyte structure ...
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