Abstract
In this study lateral force microscopy (LFM) and force modulation (FM) microscopy have been used for investigations on PbS thin films deposited on glass substrates with the successive ionic layer adsorption and reaction method (SILAR). Information of friction and surface elasticity obtained by scanning force microscopy revealed local surface properties of the thin films, which have been used to distinguish thin film constituents from environmental contamination and/or contamination due to the preparation process. Furthermore, these scanning force microscopy (SFM) applications yielded information about the surface coverage which is particularly important in the early stages of film deposition.
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