Abstract

Lateral $\beta $ -Ga2O3 MOSFET for power switching applications with a 1.8 kV breakdown voltage and a record power figure of merit of 155 MW/cm2 are demonstrated. Sub- $\mu \text{m}$ gate length combined with gate recess was used to achieve low ON-state resistances with reasonable threshold voltages above −24 V. The combination of compensation-doped high-quality crystals, implantation-based inter-device isolation, and SiN x -passivation yielded in consistently high average breakdown field strengths of 1.8–2.2 MV/cm for gate–drain spacings between 2 and 10 $\mu \text{m}$ . These values outperform the results of more established wide-bandgap device technologies, such as SiC or GaN, and the major Ga2O3 material promise—a higher breakdown strength—is well demonstrated.

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